Details

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Applications:

• Suitable for probe testing of LED chips to obtain opto-electronic output characteristics.
• Suitable for probe testing of VCSEL, EELD and DFB chips to obtain opto-electronic output characteristics.
• Suitable for probe testing of photosensitive devices such as photodiodes (PD), phototransistors (PTR), Schottky diodes and Zener diodes to obtain opto-electronic output characteristics.