IPT-9100 LED Chip & Wafer Probing And Testing System
Specifications
Details
Integrated prober & tester system! Light receiving structure by sphere & light covering design, avoid ambient light interfered! High-end lead screw, higher strength Load cell adjustment, better probe mark, longer lifetime for needle Optimized mechanical structure, increase the utilization of site Light receiving structure by sphere Available for both chip form & wafer form.
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